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SiC power MOSFET overload detection, short-circuit protection and gate-oxide integrity monitoring using a switched resistors dual-channel gate-driver
by
Picot-Digoix, M.
,
Richardeau, F.
,
Jouha, W.
,
Blaquière, J.-M.
,
Vinnac, S.
,
Azzopardi, S.
,
Le, T.-L.
Published in
Microelectronics and reliability
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Microelectronics And Reliability
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Microelectronics Reliability/Microelectronics And Reliability
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Electric Power
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Engineering
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Engineering Sciences
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Engineering, Electrical & Electronic
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Fault Detection
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Gate-Driver
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Microelectronics
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Power Transistor
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Short-Circuit
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Sic Mosfet
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Silicon Carbide
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Wide Band Gap Semiconductors
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