Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings by Tan, S.X.D., Shi, C.J.R., Jyh-Chwen Lee

Get full text

Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings by Tan, Xiang-Dong, Shi, C-J Richard, Lungeanu, Dragos, Lee, Jyh-Chwen, Yuan, Li-Pen

Get full text

Theoretical and experimental determination of deep trap profiles in semiconductors by ZHAO, J. H, JYH-CHWEN LEE, FANG, Z. Q, SCHLESINGER, T. E, MILNES, A. G

Get full text

The effects of the nonabrupt depletion edge on deep-trap profiles determined by deep-level transient spectroscopy by ZHAO, J. H, JYH-CHWEN LEE, FANG, Z. Q, SCHLESINGER, T. E, MILNES, A. G

Get full text

An effective current source cell model for VDSM delay calculation by Korshak, A., Jyh-Chwen Lee

Request full text

Electrical isolation design rule for GaAs integrated circuits fabricated on semi-insulating substrates by Lee, J.-C., Strojwas, A.J., Schlesinger, T.E., Milnes, A.G.

Get full text

Quenching of band-edge photoluminescence in InP by Cu by JYH-CHWEN LEE, MILNES, A. G, SCHLESINGER, T. E

Get full text

Erratum: ‘‘Theoretical and experimental determination of deep trap profiles in semiconductors’’ [J. Appl. Phys. 6 1 , 1063 (1987)] by Zhao, Jian H., Lee, Jyh-Chwen, Fang, Z. Q., Schlesinger, T. E., Milnes, A. G.

Get full text

Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings by Xiang-Dong Tan, Shi, C.-J.R., Lungeanu, D., Jyh-Chwen Lee, Li-Pen Yuan

Request full text