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Characterization of flatband voltage roll-off and roll-up behavior in La2O3/silicate gate dielectric
by
KAKUSHIM, K
,
KOYANAGI, T
,
TACHI, K
,
SONG, J
,
AHMET, P
,
TSUTSUI, K
,
SUGII, N
,
HATTORI, T
,
IWAI, H
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Solid-state electronics
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Solid-State Electronics
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Applied Sciences
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Condensed Matter Physics
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Dielectric, Amorphous And Glass Solid Devices
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Electrical And Electronic Engineering
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Electronic, Optical And Magnetic Materials
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Electronics
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Engineering
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Engineering, Electrical & Electronic
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Exact Sciences And Technology
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Hard X-Ray Photoelectron Spectroscopy
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High-K Gate Dielectric
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Lanthanum Oxide
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Materials Chemistry
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Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
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Silicate
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Backfile Package - Materials Science [Yms]
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