A Dependable Microelectronic Peptide Synthesizer Using Electrode Data by Kerkhoff, H. G., Zhang, X., Mailly, F., Nouet, P., Liu, H., Richardson, A.

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Shake-off on inner-shell resonances of Ar, Kr and Xe by Heimann, P A, Lindle, D W, Ferrett, T A, Liu, S H, Medhurst, L J, Piancastelli, M N, Shirley, D A, Becker, U, Kerkhoff, H G, Langer, B, Szostak, D, Wehlitz, R

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Decay of the Xe 4d to np excitations: resonant shake-off versus shake-up and spectator transitions by Becker, U, Szostak, D, Kupsch, M, Kerkhoff, H G, Langer, B, Wehlitz, R

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Observation of many new argon valence satellites near threshold by BECKER, U, LANGER, B, SHIRLEY, D. A, KERKHOFF, H. G, KUPSCH, M, SZOSTAK, D, WEHLITZ, R, HEIMANN, P. A, LIU, S. H, LINDLE, D. W, FERRETT, T. A

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Testable design and testing of micro-electro-fluidic arrays by Kerkhoff, H.G., Acar, M.

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Testing of a microanalysis system by Kerkhoff, H.G.

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Structural testing of the HYPRES niobium process by Joseph, A.A., Sese, J., Flokstra, J., Kerkhoff, H.G.

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Defect-oriented testing of Josephson logic circuits and systems by Kerkhoff, H.G., Speek, H.

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Testability analysis of analog systems by Hemink, G.J., Meijer, B.W., Kerkhoff, H.G.

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A new test generation approach for embedded analogue cores in SoC by Stancic, M., Fang, L., Weusthof, M.H.H., Tijink, R.M.W., Kerkhoff, H.G.

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Subshell photoionization of Xe between 40 and 1000 eV by BECKER, U, SZOSTAK, D, KERKHOFF, H. G, KUPSCH, M, LANGER, B, WEHITZ, R, YAGISHITA, A, HAYAISHI, T

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The detection of defects in a niobium tri-layer process by Joseph, A.A., Heuvelmans, S., Gerritsma, G.J., Kerkhoff, H.G.

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Test structures and their application in structural testing of digital RSFQ circuits by Joseph, Arun A., Heuvelmans, Sander, Gerritsma, Gerrit J., Kerkhoff, Hans G.

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Near-threshold resonance enhancement of neon valence satellites studied with synchrotron radiation by BECKER, U, HÖLZEL, R, KERKHOFF, H. G, LANGER, B, SZOSTAK, D, WEHLITZ, R

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On the maximization of the sustained switching activity in a processor by Cantoro, R., Reorda, M. Sonza, Rohani, A., Kerkhoff, H. G.

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Monitoring active filters under automotive aging scenarios with embedded instrument by Jinbo Wan, Kerkhoff, H. G.

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Shape-resonant and many-electron effects in the S 2p photoionization of SF6 by FERRETT, T. A, LINDLE, D. W, HEIMANN, P. A, PIANCASTELLI, M. N, KOBRIN, P. H, KERKHOFF, H. G, BECKER, U, BREWER, W. D, SHIRLEY, D. A

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An on-line soft error mitigation technique for control logic of VLIW processors by Rohani, A., Kerkhoff, H. G.

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VHDL-AMS fault simulation for testing DNA bio-sensing arrays by Kerkhoff, H.G., Zhang, X., Liu, H., Richardson, A., Nouet, P., Azais, F.

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Electron-ejection asymmetries by molecular orientation following K-shell excitation of CO by BECKER, U, HÖLZEL, R, KERKHOFF, H. G, LANGER, B, SZOSTAK, D, WEHLITZ, R

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