Search Results - KYRSTA, Stepan

  • Showing 1 - 7 results of 7
Refine Results
  1. 1
    Structure of the Ge–Sb–Te phase-change materials studied by theory and experiment

    Structure of the Ge–Sb–Te phase-change materials studied by theory and experiment by Sun, Zhimei, Kyrsta, Stepan, Music, Denis, Ahuja, Rajeev, Schneider, Jochen M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Self-Organized Hexagonal Patterns of Independent Magnetic Nanodots

    Self-Organized Hexagonal Patterns of Independent Magnetic Nanodots by Bobek, T., Mikuszeit, N., Camarero, J., Kyrsta, S., Yang, L., Niño, M. Á., Hofer, C., Gridneva, L., Arvanitis, D., Miranda, R., de Miguel, J. J., Teichert, C., Kurz, H.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Effect of a BN interlayer on the tensile strength of NiAl coated sapphire fibers

    Effect of a BN interlayer on the tensile strength of NiAl coated sapphire fibers by Hajas, David E., Kyrsta, Stepan, Schneider, Jochen M.

    Published in Scripta materialia
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    A new method to examine interfacial reactions of a multilayered system NiAl-Hf-hBN on a sapphire fibre

    A new method to examine interfacial reactions of a multilayered system NiAl-Hf-hBN on a sapphire fibre by RICHTER, Silvia, KYRSTA, Stepan, SCHNEIDER, Jochen, HAJAS, David, MAYER, Joachim

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    Characterization of Ge–Sb–Te thin films deposited using a composition-spread approach

    Characterization of Ge–Sb–Te thin films deposited using a composition-spread approach by Kyrsta, Stepan, Cremer, Rainer, Neuschütz, Dieter, Laurenzis, Martin, Haring Bolivar, Peter, Kurz, Heinrich

    Published in Thin solid films
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  6. 6
    Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB)

    Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB) by B ckins, Matthias, Aretz, Anke, Richter, Silvia, Kyrsta, Stepan, Sp hn, Michael, Mayer, Joachim

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  7. 7
    Characterization of Ge-Sb-Te thin films deposited using a composition-spread approach

    Characterization of Ge-Sb-Te thin films deposited using a composition-spread approach by KYRSTA, Stepan, CREMER, Rainer, NEUSCHÜTZ, Dieter, LAURENZIS, Martin, BOLIVAR, Peter Haring, KURZ, Heinrich

    Get full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: