X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation by Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.

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Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures by Olikhovskii, S. I., Molodkin, V. B., Skakunova, O. S., Len, E. G., Kyslovskyy, Ye. M., Vladimirova, T. P., Reshetnyk, O. V., Kochelab, E. V., Lizunova, S. V., Pylypiv, V. M., Ostafiychuk, B. K., Garpul, O. Z.

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Dynamical X-ray diffractometry of the defect structure of garnet crystals by Pylypiv, V. M., Vladimirova, T. P., Fodchuk, I. M., Ostafiychuk, B. K., Kyslovskyy, Ye. M., Molodkin, V. B., Olikhovskii, S. I., Reshetnyk, O. V., Skakunova, O. S., Lizunov, V. V., Garpul', O. Z.

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Combined double- and triple-crystal X-ray diffractometry with account for real defect structures in all crystals of X-ray optical schemes by Shpak, A. P., Molodkin, V. B., Olikhovskii, S. I., Kyslovskyy, Ye. M., Reshetnyk, O. V., Vladimirova, T. P., Len, E. G., Nizkova, A. I., Venger, V. M., Dmitriev, S. V.

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Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry by Kyslovskyy, Ye. M., Vladimirova, T. P., Olikhovskii, S. I., Molodkin, V. B., Kochelab, E. V., Seredenko, R. F.

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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging by MOLODKIN, V. B, OLIKHOVSKII, S. I, FODCHUK, I. M, LYTVYNCHUK, T. V, KLAD'KO, V. P, SWIATEK, Z, LEN, E. G, SHELUDCHENKO, B. V, LIZUNOVA, S. V, KYSLOVS'KYY, Ye. M, VLADIMIROVA, T. P, KOCHELAB, E. V, RESHETNYK, O. V, DOVGANYUK, V. V

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Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field by Vladimirova, T. P.

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Dynamical X-ray diffractometry of the defect structure of garnet crystals : High-resolution X-ray Diffraction and Imaging by PYLYPIV, V. M, VLADIMIROVA, T. P, GARPUL, O. Z, FODCHUK, I. M, OSTAFIYCHUK, B. K, KYSLOVSKYY, Ye. M, MOLODKIN, V. B, OLIKHOVSKII, S. I, RESHETNYK, O. V, SKAKUNOVA, O. S, LIZUNOV, V. V

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Double- and triple-crystal X-ray diffractometry of microdefects in silicon by Molodkin, V.B.

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