Search Results - Kae-Dong Baek

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    Characterization and Reliability Verification of Wafer-Level Hermetic Package with Nano-Liter Cavity for RF-MEMS Applications

    Characterization and Reliability Verification of Wafer-Level Hermetic Package with Nano-Liter Cavity for RF-MEMS Applications by Suk-Jin Ham, Byung-Gil Jeong, Ji-Hyuk Lim, Kyu-Dong Jung, Kae-Dong Baek, Woon-Bae Kim, Chang-Youl Moon

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