Search Results - Kae-Nune, Patrick

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Surface recombination probabilities of H on stainless steel, a-Si:H and oxidized silicon determined by threshold ionization mass spectrometry in H2 RF discharges

    Surface recombination probabilities of H on stainless steel, a-Si:H and oxidized silicon determined by threshold ionization mass spectrometry in H2 RF discharges by KAE-NUNE, P, PERRIN, J, JOLLY, J, GUILLON, J

    Published in Surface science
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Surface recombination probabilities of H on stainless steel, a-Si:H and oxidized silicon determined by threshold ionization mass spectrometry in H 2 RF discharges

    Surface recombination probabilities of H on stainless steel, a-Si:H and oxidized silicon determined by threshold ionization mass spectrometry in H 2 RF discharges by Kae-Nune, Patrick, Perrin, Jérôme, Jolly, Jacques, Guillon, Jean

    Published in Surface science
    Get full text
    Article
    Save to List
    Saved in:
  3. 3
    Mass Spectrometry Detection of SiH m and CH m Radicals from SiH 4 –CH 4 –H 2 RF Discharges under High Temperature Deposition Conditions of Silicon Carbide

    Mass Spectrometry Detection of SiH m and CH m Radicals from SiH 4 –CH 4 –H 2 RF Discharges under High Temperature Deposition Conditions of Silicon Carbide by Kae-Nune, Patrick, Perrin, Jérôme, Jean Guillon, Jean Guillon, Jacques Jolly, Jacques Jolly

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: