Search Results - Kanclíř, Vít

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  1. 1
    Optically modified second harmonic generation in silicon oxynitride thin films via local layer heating

    Optically modified second harmonic generation in silicon oxynitride thin films via local layer heating by Lukeš, Jakub, Kanclíř, Vít, Václavík, Jan, Melich, Radek, Fuchs, Ulrike, Žídek, Karel

    Published in Scientific reports
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  2. 2
    Sub-bandgap laser-induced fluorescence in the CaF2 via a linear process

    Sub-bandgap laser-induced fluorescence in the CaF2 via a linear process by Guesmi, Mariem, Thoř, Tomáš, Procháska, František, Hlubučková, Martina, Kanclíř, Vít, Taboubi, Oumayma, Šeděnková, Ivana, Žídek, Karel

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  3. 3
    Bulk and interface second harmonic generation in the Si 3 N 4 thin films deposited via ion beam sputtering

    Bulk and interface second harmonic generation in the Si 3 N 4 thin films deposited via ion beam sputtering by Das, Nirmal Kumar, Kanclíř, Vít, Mokrý, Pavel, Žídek, Karel

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  4. 4
    Probing buried interfaces in SiO x N y thin films via ultrafast acoustics: The role transducing layer thickness

    Probing buried interfaces in SiO x N y thin films via ultrafast acoustics: The role transducing layer thickness by Tauchmanová, Martina, Mokrý, Pavel, Kanclíř, Vít, Václavík, Jan, Veselá, Petra, Žídek, Karel

    Published in EPJ Web of conferences
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  5. 5
    Probing buried interfaces in SiOxNy thin films via ultrafast acoustics: The role transducing layer thickness

    Probing buried interfaces in SiOxNy thin films via ultrafast acoustics: The role transducing layer thickness by Tauchmanová Martina, Mokrý Pavel, Kanclíř Vít, Václavík Jan, Veselá Petra, Žídek Karel

    Published in EPJ Web of conferences
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  6. 6
    Study of defects in fused silica via a Franck-Condon analysis

    Study of defects in fused silica via a Franck-Condon analysis by Guesmi, Mariem, Kanclíř, Vít, Thoř, Tomáš, Taboubi, Oumayma, Šeděnková, Ivana, Panthi, Yadu Ram, Pfleger, Jiri, Žídek, Karel

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  7. 7
    Precision of silicon oxynitride refractive-index profile retrieval using optical characterization

    Precision of silicon oxynitride refractive-index profile retrieval using optical characterization by Kanclíř, Vít, Václavík, Jan, Žídek, Karel

    Published in arXiv.org
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  8. 8
    Sensitive optical coating defect detection via second harmonic generation

    Sensitive optical coating defect detection via second harmonic generation by Lukeš, Jakub, Hájková, Věra, Hlubučková, Martina, Kanclíř, Vít, Žídek, Karel

    Published in arXiv.org
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  9. 9
    Optically enhanced second harmonic generation in silicon oxynitride thin films via local layer heating

    Optically enhanced second harmonic generation in silicon oxynitride thin films via local layer heating by Lukeš, Jakub, Kanclíř, Vít, Václavík, Jan, Melich, Radek, Fuchs, Ulrike, Žídek, Karel

    Published in arXiv.org
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