Simulation method and application for the hot carrier-induced device degradation of NMOSFET by Sun-Ghil Lee, Jae-Hoon Choi, Sang-Yong Kim, Myung-Hee Nam, Joo-Hyeon Lee, Kang-Bong Seo, Han-Sub Yoon

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Metal Bit-line Common contact integration technology in 0.17μm-DRAM & merged DRAM in Logic devices by SIYOUNG CHOI, YOO, B.-Y, KIM, J.-H, CHOI, S.-M, LEE, H.-D, KANG, H.-K, PARK, Y.-J, PARK, J.-W, LEE, M.-Y

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Metal bit-line common contact integration technology in 0.17 /spl mu/m-DRAM and merged DRAM in logic devices by Siyoung Choi, Bong-Young Yoo, Jae-Hak Kim, Seung-Man Choi, Hyeon-Deok Lee, Ho-Kyu Kang, Yong-Jik Park, Jong-Woo Park, Moon-Yong Lee

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Case Reports : A Case of Bronchiolitis Obliterans Organizing Pneumonia Associated with Adenovirus by Jin Seok Jeon, Hyeon A Yi, Shin Young Ki, Seong Whan Jeong, Soo Taek Uh, So Young Jin, Jai Soung Park, Deuk Lin Choi, Chang Hee Kang, Joo Sung Kim, Choon Sik Park

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Two-Ply Carbon Nanotube Fiber-Typed Enzymatic Biofuel Cell Implanted in Mice by Lee, Dong Yeop, Yun, Ji-Hyun, Park, Young Bin, Hyeon, Jae Sang, Jang, Yongwoo, Choi, Young-Bong, Kim, Hyug-Han, Kang, Tong Mook, Ovalle, Raquel, Baughman, Ray H., Kim, Sung Min, Kee, Chang Won, Kim, Seon Jeong

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