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Search Results - Kareem, Pervaiz
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Synthesis of Lithography Test Patterns Using Machine Learning Model
by
Kareem, Pervaiz
,
Shin, Youngsoo
Published in
IEEE transactions on semiconductor manufacturing
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Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling
by
Cho, Gangmin
,
Kwon, Yonghwi
,
Kareem, Pervaiz
,
Shin, Youngsoo
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IEEE transactions on semiconductor manufacturing
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Layout Pattern Synthesis for Lithography Optimizations
by
Kareem, Pervaiz
,
Kwon, Yonghwi
,
Shin, Youngsoo
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IEEE transactions on semiconductor manufacturing
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Offset aperture based hardware architecture for real-time depth extraction
by
Yun, Woojin
,
Kim, Young-Gyu
,
Lee, Yeongmin
,
Lim, Jinyeon
,
Choi, Wonseok
,
Khan, Muhammad Umar Karim
,
Khan, Asim
,
Homidov, Said
,
Kareem, Pervaiz
,
Park, Hyun Sang
,
Kyung, Chong-Min
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