Search Results - Kary Chien, Wei-Ting

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  1. 1
    AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition

    AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition by Wang, Junliang, Yang, Zhengliang, Zhang, Jie, Zhang, Qihua, Chien, Wei-Ting Kary

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  2. 2
    Apply DFT Integrated Enhanced EBAC Methodology on Defect Isolations

    Apply DFT Integrated Enhanced EBAC Methodology on Defect Isolations by Kary Chien, Wei-Ting, Lester Yin, Yuanzi

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  3. 3
    Fast Semiconductor Reliability Assessments Using SPRT

    Fast Semiconductor Reliability Assessments Using SPRT by Chien, Wei-Ting Kary, Chung, Andrew, Kuo, Way

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  4. 4
    Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing

    Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing by Tian, Wenxing, You, Hailong, Zhang, Chunfu, Kang, Sheng, Jia, Xinzhang, Chien, Wei-Ting Kary

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  5. 5
    A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing

    A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing by Wei-Ting Kary Chien, Yang, S.F.

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  6. 6
    THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY

    THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY by KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF

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  7. 7
    Reliability Baseline Management and Applications in Semiconductor Manufacturing

    Reliability Baseline Management and Applications in Semiconductor Manufacturing by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Mark, Li, Ming

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  8. 8
    Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies

    Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Liwen, Wang, Zhijuan

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  9. 9
    Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests

    Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhu, Yueqin, Song, Yongliang

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  10. 10
    Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index

    Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index by Yang, Siyuan Frank, Chien, Wei-Ting Kary

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  11. 11
    A Study On The Dielectric Intrinsic Breakdown Specification

    A Study On The Dielectric Intrinsic Breakdown Specification by Han, Kun, Zhao, Yong A., Guo, Qiang, Chien, Wei-Ting Kary

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  12. 12
    Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs

    Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs by Chien, Wei-Ting Kary, Li, Ming

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  13. 13
    A cost-effective wafer-level reliability test system for integrated circuit makers

    A cost-effective wafer-level reliability test system for integrated circuit makers by Tseng, Summer Fan-Chung, Chien, Wei-Ting Kary, Gong, Excimer, Cai, Bing-Chu

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  14. 14
    A method to group reliability data by hierarchical clustering

    A method to group reliability data by hierarchical clustering by Sheng Kang, Chien, Wei-Ting Kary

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  15. 15
    A study for big-data (Hadoop) application in semiconductor manufacturing

    A study for big-data (Hadoop) application in semiconductor manufacturing by Sheng Kang, Wei-Ting Kary Chien, Jun Gang Yang

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  16. 16
    Early detection for quality and reliability management

    Early detection for quality and reliability management by Chien, Wei-Ting Kary, Ming Li, Zhang, Mark

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  17. 17
    Ultra low-K CPI evaluations for foundry backend and assembly saw processes

    Ultra low-K CPI evaluations for foundry backend and assembly saw processes by Jin, Morn, He, Wenwen, Yang, Kelly, Chien, Wei-Ting Kary

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  18. 18
    Board level reliability enhancements for wafer level package

    Board level reliability enhancements for wafer level package by Qiao, John, Wenwen He, Yang, Kelly, Chien, Wei-Ting Kary

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  19. 19
    The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics

    The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics by Chien, Wei-Ting Kary, Zhao, Atman Yong, Liwen Zhang, Cheng, Flora

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  20. 20
    Employing optimal experimental design to optimize the accelerated life test plan for TDDB

    Employing optimal experimental design to optimize the accelerated life test plan for TDDB by Lingxiao Cheng, Xiaofeng Xu, Yang, Siyuan Frank, Chien, Wei-Ting Kary

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