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Search Results - Kasica, R.J.
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Monte Carlo study of high performance resists for SCALPEL nanolithography
by
Ocola, L.E.
,
Li, W-Y.
,
Kasica, R.J.
,
Blakey, M.I.
,
Orphanos, P.A.
,
Waskiewicz, W.K.
,
Novembre, A.E.
,
Sato, M.
Published in
Microelectronic engineering
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Pattern processing results and characteristics for SCALPEL masks
by
Novembre, A.E.
,
Blakey, M.I.
,
Farrow, R.C.
,
Kasica, R.J.
,
Knurek, C.S.
,
Liddle, J.A.
,
Peabody, M.L.
Published in
Microelectronic engineering
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New Strategies for Improvement and Implementation of the Digital Electrostatic e-beam Array Lithography (DEAL) Concept
by
Randolph, S.J.
,
Baylor, L.R.
,
Klein, K.L.
,
Gardner, W.L.
,
Kasica, R.J.
,
Guillorn, M.A.
,
Hensley, D.K.
,
Meyer, H.M.
,
Islam, S.
,
Rack, P.D.
,
Rucker, R.
,
Rahman, T.
,
Grundman, T.
,
Bigelow, T.
,
Eliza, S.A.
,
Vijayar, R.
,
Moore, J.A.
,
Simpson, M.L.
,
Ericson, M.N.
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