Search Results - Katz, Label A.

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  1. 1
    The Well-Educated Man

    The Well-Educated Man by Katz, Label A.

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  2. 2
    The Well Educated Man

    The Well Educated Man by Mannes, Marya, McMurrin, Sterling M., Katz, Label A., Reinert, Paul C.

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  3. 3
    Laser-Induced Latchup Screening and Mitigation in CMOS Devices

    Laser-Induced Latchup Screening and Mitigation in CMOS Devices by McMorrow, D., Buchner, S., Baze, M., Bartholet, B., Katz, R., O'Bryan, M., Poivey, C., LaBel, K.A., Ladbury, R., Maher, M., Sexton, F.W.

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  4. 4
    Radiation effects on current field programmable technologies

    Radiation effects on current field programmable technologies by Katz, R., LaBel, K., Wang, J.J., Cronquist, B., Koga, R., Penzin, S., Swift, G.

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  5. 5
    Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs

    Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs by LaBel, K.A., Marshall, P.W., Barth, J.L., Katz, R.B., Reed, R.A., Leidecker, H.W., Kim, H.S., Marshall, C.J.

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  6. 6
    Current radiation issues for programmable elements and devices

    Current radiation issues for programmable elements and devices by Katz, R., Wang, J.J., Koga, R., LaBel, K.A., McCollum, J., Brown, R., Reed, R.A., Cronquist, B., Crain, S., Scott, T., Paolini, W., Sin, B.

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  7. 7
    Laser-Induced Latchup Screening and Mitigation in CMOS Devices

    Laser-Induced Latchup Screening and Mitigation in CMOS Devices by McMorrow, D., Buchner, S., Baze, M., Bartholet, B., Katz, R., O'Bryan, M., Poivey, C., Label, K.A., Ladbury, R., Maher, M., Sexton, F.

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