Field-emission liquid-metal ion source and triode ion gun by Komuro, Masanori, Kawakatsu, Hisazo

Get full text

Wave optical effects in Lorentz microscopic images of magnetic domain walls by Tsukahara, Sonoko, Kawakatsu, Hisazo

Get full text

A Measuring Method of Current Distributions of Fine-Focused Electron and Ion Beams by Shimizu, Keizo, Kawakatsu, Hisazo

Get full text

Metal Ion Source for Ion Implantation System by Shimizu, Keizo, Kawakatsu, Hisazo, Kanaya, Koichi

Get full text

Quantitative analysis of electron microscope images recorded on thin polymer films by Kanaya, Koichi, Kawakatsu, Hisazo, Atoda, Nobufumi, Yotsumoto, Haruo, Ono, Akishige

Get full text

Approximate Formula for Nuclear Stopping Cross Section by Shimizu, Keizo, Kawakatsu, Hisazo

Get full text

Experiment on the Electron Phase Microscope by Kanaya, Kōichi, Kawakatsu, Hisazo, Itō, Kazuo, Yotsumoto, Haruo

Get full text

High Quality Shadowing Using Point Evaporator by MATSUI, Shigeo, KAWAKATSU, Hisazo, ADACHI, Koichi

Get full text

Ion Beam Exposure of Resist Materials by Komuro, Masanori, Atoda, Nobufumi, Kawakatsu, Hisazo

Get full text

A Stabilization Method of Ion Beam Current by Shimizu, Keizo, Kawakatsu, Hisazo, Kanaya, Koichi

Get full text

Deflection System with Eight-pole Stigmator Used in Correcting Astigmatism by KANAYA, Koichi, KAWAKATSU, Hisazo

Get full text

Caustic Properties Due to Second and Third Order Astigmatisms of the Electron Lens by KANAYA, Koichi, KAWAKATSU, Hisazo

Get full text

Gel Formation in Negative Electron Resists by Atoda, Nobufumi, Kawakatsu, Hisazo

Get full text

Molecular-weight dependence of developed contours in poly- (methyl methacrylate) electron resists by Atoda, Nobufumi, Komuro, Masanori, Kawakatsu, Hisazo

Get full text

Space-charge Effects on Ion Beam Focusing by KAWAKATSU, Hisazo, SHIMIZU, Keizo, KANAYA, Koichi

Get full text

Magnetic Objective Lens with Small Bores by YADA, Keiji, KAWAKATSU, Hisazo

Get full text

Method of Measuring Spherical and Astigmatic Aberrations by Shadow Electron Microscope Images by KANAYA, Koichi, KAWAKATSU, Hisazo

Get full text

Electro-static Deflection System used in Electron Beam Apparatus by KAWAKATSU, Hisazo, KANAYA, Koichi

Get full text

Mechanical Aberrations of a Magnetic Quadrupole Quadruplet Lens by Kawakatsu, Hisazo, Vosburgh, Kirby G., Siegel, Benjamin M.

Get full text

Electron-Optical Properties of a Quadrupole Quadruplet Projector Lens by Kawakatsu, Hisazo, Vosburgh, Kirby G., Siegel, Benjamin M.

Get full text