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Power-Aware Test Scheduling for Memory BIST
by
Au, Albert
,
Kcpinski, Michal
,
Orczyk, Makary
,
Pogiel, Artur
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Conference Proceedings
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Subjects
Built-In Self-Test
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Instruments
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Job Shop Scheduling
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Mbist
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Memory Test
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Monitoring
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Power-Aware
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Schedules
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Scheduling Algorithms
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System-On-Chip
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Systematics
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Test Pattern Generators
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Test Power
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Voltage
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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