Search Results - Keezer, D.C.

Refine Results
  1. 1
    Bit-parallel message exchange and data recovery in optical packet switched interconnection networks

    Bit-parallel message exchange and data recovery in optical packet switched interconnection networks by Liboiron-Ladouceur, O., Gray, C., Keezer, D.C., Bergman, K.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    A 5-Gbps Test System for Wafer-Level Packaged Devices

    A 5-Gbps Test System for Wafer-Level Packaged Devices by Majid, A.M., Keezer, D.C.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Electrical test strategies for a wafer-level packaging technology

    Electrical test strategies for a wafer-level packaging technology by Keezer, D.C., Patel, C.S., Bakir, M.S., Qing Zhou, Meindl, J.D.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Electrical test strategies for a wafer-level packaging technology [Abstracts of Forthcoming Manuscripts]

    Electrical test strategies for a wafer-level packaging technology [Abstracts of Forthcoming Manuscripts] by Keezer, D.C., Patel, C.S., Bakir, M.S., Qing Zhou, Meindl, J.D.

    Get full text
    Article
    Save to List
    Saved in:
  5. 5
    A development platform and electronic modules for automated test up to 20 Gbps

    A development platform and electronic modules for automated test up to 20 Gbps by Keezer, D.C., Gray, C., Majid, A., Minier, D., Ducharme, P.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  6. 6
    Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications

    Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications by Keezer, D.C., Minier, D., Ducharme, P.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  7. 7
    An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test

    An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test by Keezer, D.C., Minier, D., Ducharme, P., Majid, A.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  8. 8
    Source-synchronous testing of multilane PCI Express and HyperTransport buses

    Source-synchronous testing of multilane PCI Express and HyperTransport buses by Keezer, D.C., Minier, D., Ducharme, P.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  9. 9
    Method for Reducing Jitter in Multi-Gigahertz ATE

    Method for Reducing Jitter in Multi-Gigahertz ATE by Keezer, D.C., Minier, D., Ducharme, P.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  10. 10
    Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network

    Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network by Gray, C.E., Liboiron-Ladouceur, O., Keezer, D.C., Bergman, K.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  11. 11
    Multi-GHz loopback testing using MEMs switches and SiGe logic

    Multi-GHz loopback testing using MEMs switches and SiGe logic by Keezer, D.C., Minier, D., Ducharme, P., Viens, D., Flynn, G., McKillop, J.S.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  12. 12
    Multiplexing ATE channels for production testing at 2.5 Gbps

    Multiplexing ATE channels for production testing at 2.5 Gbps by Keezer, D.C., Minier, D., Caron, M.-C.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  13. 13
    Modular extension of ATE to 5 Gbps

    Modular extension of ATE to 5 Gbps by Keezer, D.C., Minier, D., Paradis, M., Binette, L.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  14. 14
    Terabit-per-second automated digital testing

    Terabit-per-second automated digital testing by Keezer, D.C., Zhou, Q., Bair, C., Kuan, J., Poole, B.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  15. 15
    Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL

    Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL by Keezer, D. C., Gray, C., Majid, A., Taher, N.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  16. 16
    Multi-Gigahertz Testing of Wafer-Level Packaged Devices

    Multi-Gigahertz Testing of Wafer-Level Packaged Devices by Majid, A.M., Keezer, D.C., Jayabalan, J., Rotaru, M.R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  17. 17
    Test support processors for enhanced testability of high performance circuits

    Test support processors for enhanced testability of high performance circuits by Keezer, D.C., Zhou, Q.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  18. 18
    Low cost ATE pin electronics for multigigabit-per-second at-speed test

    Low cost ATE pin electronics for multigigabit-per-second at-speed test by Keezer, D.C., Wenzel, R.J.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  19. 19
    Challenges and solutions for multi-Gigahertz testing

    Challenges and solutions for multi-Gigahertz testing by Keezer, D.C.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  20. 20
    A 5 Gbps Wafer-Level Tester

    A 5 Gbps Wafer-Level Tester by Majid, A.M., Keezer, D.C., Karia, J.V.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: