Testing of a microanalysis system by Kerkhoff, H.G.

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Structural testing of the HYPRES niobium process by Joseph, A.A., Sese, J., Flokstra, J., Kerkhoff, H.G.

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Testing Microelectronic Biofluidic Systems by Kerkhoff, H.G.

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The detection of defects in a niobium tri-layer process by Joseph, A.A., Heuvelmans, S., Gerritsma, G.J., Kerkhoff, H.G.

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Built-In Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications by Kuiken, O.J., Xiao Zhang, Kerkhoff, H.G.

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Testable design and testing of micro-electro-fluidic arrays by Kerkhoff, H.G., Acar, M.

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Fast fault simulation for nonlinear analog circuits by Engin, N., Kerkhoff, H.G.

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Defect-oriented testing of Josephson logic circuits and systems by Kerkhoff, H.G., Speek, H.

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Tackling test trade-offs from design, manufacturing to market using economic modeling by Volkerink, E.H., Khoche, A., Kamas, L.A., Rivoir, J., Kerkhoff, H.G.

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VHDL-AMS fault simulation for testing DNA bio-sensing arrays by Kerkhoff, H.G., Zhang, X., Liu, H., Richardson, A., Nouet, P., Azais, F.

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Dependable reconfigurable multi-sensor poles for security by Kerkhoff, H.G.

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On-chip tap-delay measurements for a digital delay-line used in high-speed inter-chip data communications by Petre, O., Kerkhoff, H.G.

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Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor by Kerkhoff, H.G., Xiao Zhang

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Towards structural testing of superconductor electronics by Joseph, A.A., Kerkhoff, H.G.

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Design of a Highly Dependable Beamforming Chip by Xiao Zhang, Kerkhoff, H.G.

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A comparative analysis of multiplexer techniques for the minimization of function cost using the costtable approach (for costtable read cost-table) by Butler, J.T., Kerkhoff, H.G., Onneweer, S.

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Two improved methods for testing ADC parametric faults by digital input signals by Xiaoqin Sheng, Kerkhoff, H.G.

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Microsystem Testing: Challenge Or Common Knowledge by Kerkhoff, H.G.

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Design and test space exploration of transport-triggered architectures by Zivkovic, V.A., Tangelder, R.J.W.T., Kerkhoff, H.G.

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A low-speed BIST framework for high-performance circuit testing by Speek, H., Kerkhoff, H.G., Shashaani, M., Sachdev, M.

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