Cryptochrome mediated magnetic sensitivity in Arabidopsis occurs independently of light-induced electron transfer to the flavin by Hammad, M., Albaqami, M., Pooam, M., Kernevez, E., Witczak, J., Ritz, T., Martino, C., Ahmad, M.

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Cryptochrome mediated magnetic sensitivity in occurs independently of light-induced electron transfer to the flavin by Hammad, M, Albaqami, M, Pooam, M, Kernevez, E, Witczak, J, Ritz, T, Martino, C, Ahmad, M

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Ultra-thin strained SOI substrate analysis by pseudo-MOS measurements by Gallon, C., Fenouillet-Beranger, C., Bresson, N., Cristoloveanu, S., Allibert, F., Bord, S., Aulnette, C., Delille, D., Latu-Romain, E., Hartmann, J.M., Ernst, T., Andrieu, F., Campidelli, Y., Ghyselen, B., Cayrefourcq, I., Fournel, F., Kernevez, N., Skotnicki, T.

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Engineering strained silicon on insulator wafers with the Smart CutTM technology by Ghyselen, B., Hartmann, J.-M., Ernst, T., Aulnette, C., Osternaud, B., Bogumilowicz, Y., Abbadie, A., Besson, P., Rayssac, O., Tiberj, A., Daval, N., Cayrefourq, I., Fournel, F., Moriceau, H., Di Nardo, C., Andrieu, F., Paillard, V., Cabié, M., Vincent, L., Snoeck, E., Cristiano, F., Rocher, A., Ponchet, A., Claverie, A., Boucaud, P., Semeria, M.-N., Bensahel, D., Kernevez, N., Mazure, C.

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Engineering strained silicon on insulator wafers with the Smart Cut TM technology by Ghyselen, B., Hartmann, J.-M., Ernst, T., Aulnette, C., Osternaud, B., Bogumilowicz, Y., Abbadie, A., Besson, P., Rayssac, O., Tiberj, A., Daval, N., Cayrefourq, I., Fournel, F., Moriceau, H., Di Nardo, C., Andrieu, F., Paillard, V., Cabié, M., Vincent, L., Snoeck, E., Cristiano, F., Rocher, A., Ponchet, A., Claverie, A., Boucaud, P., Semeria, M.-N., Bensahel, D., Kernevez, N., Mazure, C.

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Scalability of advanced partially depleted n-MOSFET devices on biaxial strained SOI substrates by Flachowsky, S., Hontschel, J., Wei, A., Illgen, R., Hermann, P., Herrmann, T., Klix, W., Stenzel, R., Ramirez, A., Horstmann, M., Kernevez, N., Cayrefourcq, I., Metral, F., Kennard, M., Guiot, E.

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Smart Cut/spl trade/ transfer of 300 mm [110] and (100) Si layers for hybrid orientation technology by Bourdelle, K.K., Akatsu, T., Sousbie, N., Letertre, F., Delprat, D., Neyret, E., Ben Mohamed, N., Suciu, G., Lagahe-Blanchard, C., Beaumont, A., Charvet, A.-M., Papon, A.-M., Kernevez, N., Maleville, C., Mazure, C.

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Smart cut transfer of 300 mm (110) and (100) Si layers for hybrid orientation technology by BOURDELLE, K. K, AKATSU, T, CHARVET, A.-M, PAPON, A.-M, KEMEVEZ, N, MALEVILLE, C, MAZURE, C, SOUSBIE, N, LETERTRE, F, DELPRAT, D, NEYRET, E, BEN MOHAMED, N, SUCIU, G, LAGAHE-BLANCHARD, C, BEAUMONT, A

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Identification de paramètres dans les problèmes non linéaires à données incomplètes by Ainseba, B.-E., Kernevez, J.-P., Luce, R.

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Application des sentinelles à l'identification des pollutions dans une rivière by Ainseba, B.-E., Kernevez, J.-P., Luce, R.

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