Search Results - Kerrosa, Grégory

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    Advanced backside failure analysis in 65 nm CMOS technology

    Advanced backside failure analysis in 65 nm CMOS technology by Bianic, Stephane, Allemand, Stéphanie, Kerrosa, Grégory, Scafidi, Pascal, Renard, Didier

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    Advanced backside failure analysis in 65nm CMOS technology

    Advanced backside failure analysis in 65nm CMOS technology by Bianic, Stephane, Allemand, Stéphanie, Kerrosa, Grégory, Scafidi, Pascal, Renard, Didier

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