Search Results - Kheng-Chok Tee

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  1. 1
    Robust Electromigration reliability through engineering optimization

    Robust Electromigration reliability through engineering optimization by Ng, Wee Loon, Tee, Kheng Chok, Liu, Junfeng, Ee, Yong Chiang, Aubel, Oliver, Tan, Chuan Seng, Pey, Kin Leong

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  2. 2
    SDODEL MOSFET for performance enhancement

    SDODEL MOSFET for performance enhancement by King Jien Chui, Samudra, G.S., Yee-Chia Yeo, Kheng-Chok Tee, Leong, K.-W., Kian Meng Tee, Benistant, F., Lap Chan

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  3. 3
    Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source–Drain Diffusion Length

    Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source–Drain Diffusion Le... by See, Kwang-Seng, Lau, Wai-Shing, Liao, Hong, Eng, Chee-Wee, Tee, Kian-Meng, Quek, Elgin Kiok-Boone, Tee, Kheng-Chok, Chan, Lap-Hung

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  4. 4
    Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy

    Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy by Eng, Chee-Wee, Lau, Wai-Shing, Jiang, Yao-Yao, Vigar, David, Tee, Kheng-Chok, Chan, Lap, Lim, Vanissa Sei-Wei, Trigg, Alastair

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  5. 5
    Selective Filling and Sintering of Copper Nanoclusters for Interconnect

    Selective Filling and Sintering of Copper Nanoclusters for Interconnect by Kheng Chok Tee, Lassesson, A., van Lith, J., Brown, S.A., Partridge, J.G., Schulze, M., Blaikie, R.J.

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  6. 6
    Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11 µm Dual Gate Oxide CMOS Technology

    Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11 µm Dual Gate Oxide CMOS Technology by See, Kwang-Seng, Lau, Wai-Shing, Toh, Suey-Li, Liao, Hong, Lee, Jae Gon, Li, Kun, Quek, Elgin Kiok-Boone, Tee, Kheng-Chok, Chan, Lap-Hung

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  7. 7
    Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

    Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid by Cha, Cher-Liang, Tee, Kheng-Chok, Chor, Eng-Fong, Gong, Hao, Prasad, Krishnamachar, Bourdillon, Anthony J., See, Alex, Chan, Lap, Lee, Mike Myung-Ok

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