Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET by Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk

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