Search Results - Kim, Myoeng-Ho

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  1. 1
    Self-Aligned Coplanar Top Gate In-Ga-ZnO Thin-Film Transistors Exposed to Various DUV Irradiation Energies

    Self-Aligned Coplanar Top Gate In-Ga-ZnO Thin-Film Transistors Exposed to Various DUV Irradiation Energies by Ryu, Seung-Man, Kim, Myoeng-Ho, Jeon, Sung-Ho, Lim, Jun-Hyung, Choi, Duck-Kyun

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  2. 2
    Stability Behavior of Self-Aligned Coplanar a-IGZO Thin Film Transistors Fabricated by Deep Ultraviolet Irradiation

    Stability Behavior of Self-Aligned Coplanar a-IGZO Thin Film Transistors Fabricated by Deep Ultraviolet Irradiation by Kim, Myoeng-Ho, Choi, So-Yang, Jeon, Sung-Ho, Lim, Jun-Hyung, Choi, Duck-Kyun

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    Enhanced Stability Under Positive Bias Temperature Stress in Oxide Thin Film Transistors with Double Gate Structure By Improving Bottom Channel Interface

    Enhanced Stability Under Positive Bias Temperature Stress in Oxide Thin Film Transistors with Double Gate Structure By Improving Bottom Channel Interface by Son, Kyoung-Seok, Kim, Myoeng-Ho, Lee, Seung-Hun, Kim, Youn-Goo, Kim, Jaybum, Lee, Sunhee

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  4. 4
    Self-Aligned Coplanar Top Gate In-G-ZnO Thin-Film Transistors Exposed to Various DUV Irradiation Energies

    Self-Aligned Coplanar Top Gate In-G-ZnO Thin-Film Transistors Exposed to Various DUV Irradiation Energies by Seung-Man Ryu, Myoeng-Ho, Kim, Sung-Ho, Jeon, Jun-Hyung Lim, Choi, Duck-Kyun

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