Search Results - Kim, Soonkon

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  1. 1
    A Study on the Charge Trapping Characteristics of High-k Laminated Traps

    A Study on the Charge Trapping Characteristics of High-k Laminated Traps by Yoo, Jinhyuk, Kim, SoonKon, Jeon, Woojin, Park, Areum, Choi, Donghee, Choi, Byoungdeog

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  2. 2
    Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress

    Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress by Kim, Hyojung, Kim, Soonkon, Yoo, Jongmin, Oh, Changyong, Kim, Bosung, Hwang, Hyuncheol, Park, Jungmin, Choi, Pyungho, Song, Jangkun, Im, Kiju, Choi, Byoungdeog

    Published in AIP advances
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  3. 3
    Effect of PECVD Gate SiO2 Thickness on the Poly-Si/SiO2 Interface in Low-Temperature Polycrystalline Silicon TFTs

    Effect of PECVD Gate SiO2 Thickness on the Poly-Si/SiO2 Interface in Low-Temperature Polycrystalline Silicon TFTs by Park, Jungmin, Choi, Pyungho, Kim, Soonkon, Jeon, Bohyeon, Lee, Jongyoon, Choi, Byoungdeog

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  4. 4
    Bias stress instability of LTPS TFTs on flexible substrate with activation annealing temperature

    Bias stress instability of LTPS TFTs on flexible substrate with activation annealing temperature by Kim, Soonkon, Kim, Hyojung, Kim, Kihwan, Choi, Pyungho, Choi, Byoungdeog

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  5. 5
    Rapid ultrasensitive and specific BNP biosensor with LED readout

    Rapid ultrasensitive and specific BNP biosensor with LED readout by So, Seth, Torres Quiñones, Jorge, Kim, Soonkon, Choi, Byoungdeog, Yun, Minhee

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  6. 6
    Improvement of negative bias temperature instability of LTPS TFTs by high pressure H2O annealing

    Improvement of negative bias temperature instability of LTPS TFTs by high pressure H2O annealing by Kim, Soonkon, Kim, Hyojung, Kim, Kihwan, Choi, Pyungho, Choi, Byoungdeog

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  7. 7
    Gate leakage current reduction and improved reliability with an ultra-thin Ti layer for low-power applications

    Gate leakage current reduction and improved reliability with an ultra-thin Ti layer for low-power applications by Park, Jungmin, Choi, Pyungho, Kim, Soonkon, Kang, Heesung, Ku, Jahum, Choi, Byoungdeog

    Published in Thin solid films
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  8. 8
    The Effects of Valence Band Offset on Threshold Voltage Shift in a-InGaZnO TFTs Under Negative Bias Illumination Stress

    The Effects of Valence Band Offset on Threshold Voltage Shift in a-InGaZnO TFTs Under Negative Bias Illumination Stress by Kim, Hyojung, Im, Kiju, Park, Jongwoo, Khim, Taeyoung, Hwang, Hyuncheol, Kim, Soonkon, Lee, Sangmin, Song, Minjun, Choi, Pyungho, Song, Jangkun, Choi, Byoungdeog

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  9. 9
    Degradation modeling with spatial mapping method in low temperature poly silicon thin film transistor aged off-state bias

    Degradation modeling with spatial mapping method in low temperature poly silicon thin film transistor aged off-state bias by Kim, Kihwan, Song, Minjoon, Kim, Soonkon, Kim, Hyojung, Jeon, Sangho, Cho, Youngmi, Kim, Yongjo, Choi, Byoungdeog

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  10. 10
    P‐8: Degradation Model of LTPS TFT Aged off‐State Bias Stress on Flexible Substrate

    P‐8: Degradation Model of LTPS TFT Aged off‐State Bias Stress on Flexible Substrate by Kim, Kihwan, Kim, Hyojung, Song, Minjun, Kim, Soonkon, Cho, Hyunguk, Cho, Youngmi, Kim, Yongjo, Choi, Byungdeog

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