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Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction
by
Seo, Sungyoul
,
Lee, Yong
,
Lim, Hyeonchan
,
Lee, Joohwan
,
Yoo, Hongbom
,
Kim, Yojoung
,
Kang, Sungho
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Automatic Test Pattern Generation
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Benchmarking
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Chains
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Circuits
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Computer Science
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Computer Science, Hardware & Architecture
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Design-For-Testability
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Low Power Scan Testing
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Low-Shift Power X-Fill
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Mathematical Model
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Power Consumption
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Power Demand
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Reduction
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Scan Based-Testing
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Science & Technology
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Shifting Power Reduction
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Stitching
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Ieee Electronic Library (Iel) Conference Proceedings
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