Search Results - Kiran, Chakravadhanula VS

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    Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties

    Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties by Neelisetty, Krishna Kanth, Gutsch, Sebastian, von Seggern, Falk, Molinari, Alan, Vahl, Alexander, Mu, Xiaoke, Scherer, Torsten, Kiran, Chakravadhanula VS, Kübel, Christian

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    Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations

    Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations by Neelisetty, Krishna Kanth, Mu, Xiaoke, Gutsch, Sebastian, Vahl, Alexander, Molinari, Alan, von Seggern, Falk, Hansen, Mirko, Scherer, Torsten, Zacharias, Margit, Kienle, Lorenz, Chakravadhanula, VS Kiran, Kübel, Christian

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    Novel thin film lift-off process for in situ TEM tensile characterization

    Novel thin film lift-off process for in situ TEM tensile characterization by Neelisetty, Krishna Kanth, CN, Shyam Kumar, Kashiwar, Ankush, Scherer, Torsten, Chakravadhanula, VS Kiran, Kuebel, Christian

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