Search Results - Kitai, Kazutoshi

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  1. 1
    Accumulation of metals and cellular distribution of aluminum in the liverwort Scapania undulata, in acidic and neutral streams in Japan

    Accumulation of metals and cellular distribution of aluminum in the liverwort Scapania undulata, in acidic and neutral streams in Japan by Yoshimura, Etsuro, Kitai, Kazutoshi, Nishizawa, Naoko K., Satake, Ken'ichi, Mori, Satoshi, Yamazaki, Sunao

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  2. 2
    Reduction of background carrier concentration and lifetime improvement for 4H-SiC C-face epitaxial growth

    Reduction of background carrier concentration and lifetime improvement for 4H-SiC C-face epitaxial growth by Nishio, Johji, Kushibe, Mitsuhiro, Asamizu, Hirokuni, Kitai, Hidenori, Kojima, Kazutoshi

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  3. 3
    Increased Waist Circumference after One-Year Is Associated with Poor Chewing Status

    Increased Waist Circumference after One-Year Is Associated with Poor Chewing Status by Yamazaki, Riku, Iwai, Komei, Azuma, Tetsuji, Yonenaga, Takatoshi, Sasai, Yasuyuki, Watanabe, Kazutoshi, Obora, Akihiro, Deguchi, Fumiko, Kojima, Takao, Tome, Wakako, Kitai, Noriyuki, Tomofuji, Takaaki

    Published in Healthcare (Basel)
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  4. 4
    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO2/4H-SiC(0001) and

    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO2/4H-SiC(0001) and by Shiomi, Hiromu, Kitai, Hidenori, Tsujimura, Masatoshi, Kiuchi, Yuji, Nakata, Daisuke, Ono, Shuichi, Kojima, Kazutoshi, Fukuda, Kenji, Sakamoto, Kunihiro, Yamasaki, Kimiyohi, Okumura, Hajime

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  5. 5
    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO 2 /4H-SiC(0001) and

    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO 2 /4H-SiC(0001) and by Shiomi, Hiromu, Kitai, Hidenori, Tsujimura, Masatoshi, Kiuchi, Yuji, Nakata, Daisuke, Ono, Shuichi, Kojima, Kazutoshi, Fukuda, Kenji, Sakamoto, Kunihiro, Yamasaki, Kimiyohi, Okumura, Hajime

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  6. 6
    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO sub(2)/4H-SiC(0001) and (0001)

    Electrical and physical characterizations of the effects of oxynitridation and wet oxidation at the interface of SiO sub(2)/4H-SiC(0001) and (0001) by Shiomi, Hiromu, Kitai, Hidenori, Tsujimura, Masatoshi, Kiuchi, Yuji, Nakata, Daisuke, Ono, Shuichi, Kojima, Kazutoshi, Fukuda, Kenji, Sakamoto, Kunihiro, Yamasaki, Kimiyohi, Okumura, Hajime

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