Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures by Olikhovskii, S. I., Molodkin, V. B., Skakunova, O. S., Len, E. G., Kyslovskyy, Ye. M., Vladimirova, T. P., Reshetnyk, O. V., Kochelab, E. V., Lizunova, S. V., Pylypiv, V. M., Ostafiychuk, B. K., Garpul, O. Z.

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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation by Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.

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Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry by Kyslovskyy, Ye. M., Vladimirova, T. P., Olikhovskii, S. I., Molodkin, V. B., Kochelab, E. V., Seredenko, R. F.

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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging by MOLODKIN, V. B, OLIKHOVSKII, S. I, FODCHUK, I. M, LYTVYNCHUK, T. V, KLAD'KO, V. P, SWIATEK, Z, LEN, E. G, SHELUDCHENKO, B. V, LIZUNOVA, S. V, KYSLOVS'KYY, Ye. M, VLADIMIROVA, T. P, KOCHELAB, E. V, RESHETNYK, O. V, DOVGANYUK, V. V

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Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons by Kislovskii, E. N., Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad’ko, V. P.

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Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field by Vladimirova, T. P.

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