Search Results - Koga, Rocky

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  1. 1
    Neutron Soft Errors in Xilinx FPGAs at Lawrence Berkeley National Laboratory

    Neutron Soft Errors in Xilinx FPGAs at Lawrence Berkeley National Laboratory by George, J.S., Koga, R., McMahan, M.A.

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  2. 2
    Single Event Burnout Observed in Schottky Diodes

    Single Event Burnout Observed in Schottky Diodes by George, Jeffrey S., Koga, Rocky, Moision, Robert M., Arroyo, Arturo

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  3. 3
    Application of hardness-by-design methodology to radiation-tolerant ASIC technologies

    Application of hardness-by-design methodology to radiation-tolerant ASIC technologies by Lacoe, R.C., Osborn, J.V., Koga, R., Brown, S., Mayer, D.C.

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  4. 4
    Single Event Effects Tests on the Actel RTAX2000S FPGA

    Single Event Effects Tests on the Actel RTAX2000S FPGA by George, J.S., Koga, R., Zakrzewski, M.

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  5. 5
    SEE Testing of the DDC BU-61583 Advanced Communication Engine

    SEE Testing of the DDC BU-61583 Advanced Communication Engine by George, J., Koga, R.

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  6. 6
    Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

    Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators by LaLumondiere, S.D., Koga, R., Yu, P., Maher, M.C., Moss, S.C.

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  7. 7
    Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

    Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures by Moss, S.C., LaLumondiere, S.D., Scarpulla, J.R., MacWilliams, K.P., Crain, W.R., Koga, R.

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  8. 8
    Wavelength dependence of transient laser-induced latchup in epi-CMOS test structures

    Wavelength dependence of transient laser-induced latchup in epi-CMOS test structures by LaLumondiere, S.D., Koga, R., Osborn, J.V., Mayer, D.C., Lacoe, R.C., Moss, S.C.

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  9. 9
    A Radiation Hardened High Voltage 16:1 Analog Multiplexer for Space Applications (NGCP3580)

    A Radiation Hardened High Voltage 16:1 Analog Multiplexer for Space Applications (NGCP3580) by Adams, D.A., Barnes, H.A., Fitzpatrick, M.D., Goldstein, N.P., Hand, W.L., Jackson, W.L., Koga, R., Pennock, M.B., Remenapp, H.J., Smith, J.T.

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  10. 10
    Temperature dependence of single-event burnout in n-channel power MOSFETs (for space application)

    Temperature dependence of single-event burnout in n-channel power MOSFETs (for space application) by Johnson, G.H., Schrimpf, R.D., Galloway, K.F., Koga, R.

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  11. 11
    SEU characterization of hardened CMOS SRAMs using statistical analysis of feedback delay in memory cells

    SEU characterization of hardened CMOS SRAMs using statistical analysis of feedback delay in memory cells by Kohler, R.A., Koga, R.

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  12. 12
    Foreign comparative test of space qualified digital signal processors

    Foreign comparative test of space qualified digital signal processors by Sampson, S., Duggan, P., Burnell, R., McEndree, S., Tausch, J., Sleeter, D., Alexander, D., Koga, R., Yu, P., Crain, S.

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  13. 13
    Advantages of the LBL 88-Inch Cyclotron Ion Beam for SEP Studies

    Advantages of the LBL 88-Inch Cyclotron Ion Beam for SEP Studies by Koga, Rocky, Pinkerton, Steven D

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  14. 14
    Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs

    Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs by George, J., Swift, G., Guertin, S., Carmichael, C., Rezgui, S., Koga, R.

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  15. 15
    Foreign Comparative Test of Space Qualified Digital Signal Processors

    Foreign Comparative Test of Space Qualified Digital Signal Processors by Sampson, Steve, Duggan, Paul, Burnell, Richard, McEndree, Steven, Tausch, Jake, Sleeter, David, Alexander, David, Koga, Rocky, Yu, Paul, Crain, Susan

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