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Comparison of Single Event Transients Generated by Short Pulsed X-Rays, Lasers and Heavy Ions
by
Cardoza, David
,
LaLumondiere, Stephen D.
,
Tockstein, Michael A.
,
Brewe, Dale L.
,
Wells, Nathan P.
,
Koga, Rokutaro
,
Gaab, Kevin M.
,
Lotshaw, William T.
,
Moss, Steven C.
Published in
IEEE transactions on nuclear science
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The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability
by
Mayer, D.C.
,
Koga, R.
,
Womack, J.M.
Published in
IEEE transactions on nuclear science
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Heavy-Ion-Induced Snapback in CMOS Devices
by
Koga, Rokutaro
,
Kolasinski, Wojciech A
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Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms
by
Koga, Rokutaro
,
Kolasinski, Wojciech A
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High resolution gamma-ray telescope using a coded aperture mask and drift chamber
by
Carter, John N.
,
Ramsden, David
,
Frye, Glenn M.
,
Jenkins, Thomas L.
,
Koga, Rokutaro
Published in
Monthly notices of the Royal Astronomical Society
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Techniques of Microprocessor Testing and SEU (Single Event Upset)-Rate Prediction
by
Koga,Rokutaro
,
Kolasinski,Wojciech A
,
Marra,Michael T
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Heavy-Ion Induced Single Event Upsets in a Bipolar Logic Device
by
Kolasinski,Wojciech A
,
Koga,Rokutaro
,
Chenette,David L
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EOSCOR III, a High Energy Solar Neutron Detector
by
koga, Rokutaro
,
Frye, Glenn M.
,
Denehy, Brian V.
,
Mace, Owen
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IEEE transactions on nuclear science
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