Search Results - Kolotovsky, Yuriy

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    Continuous-scan capability at SSRL and applications to X-ray diffraction

    Continuous-scan capability at SSRL and applications to X-ray diffraction by Li, Chunlei, Kiss, Andrew M., Van Campen, Douglas G., Garachtchenko, Alex, Kolotovsky, Yuriy, Stone, Kevin, Xu, Yahong, Zhang, Wenjun, Corbett, Jeff

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