Search Results - Koneru, Abhishek
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An inter-layer interconnect BIST solution for monolithic 3D ICs
Conference Proceeding -
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A Design-for-Test Solution for Monolithic 3D Integrated Circuits
Conference Proceeding -
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Online soft-error vulnerability estimation for memory arrays
Conference Proceeding -
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Impact of wafer-bonding defects on Monolithic 3D integrated circuits
Conference Proceeding -
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Self-awareness and self-learning for resiliency in real-time systems
Conference Proceeding -
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