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    Transient-current measurement of the trap charge density at interfaces of a thin-film metal∕ferroelectric∕metal structure

    Transient-current measurement of the trap charge density at interfaces of a thin-film metal∕ferroelectric∕metal structure by Delimova, L. A., Grekhov, I. V., Mashovets, D. V., Tyaginov, S. E., Shin, Sangmin, Koo, June-Moo, Kim, Suk-Pil, Park, Youngsoo

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