Search Results - Kopley, Thomas E

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  1. 1
    Effects of Die-Attach Voids on the Thermal Impedance of Power Electronic Packages

    Effects of Die-Attach Voids on the Thermal Impedance of Power Electronic Packages by Singh, Sujay, Jifa Hao, Hoffman, Daniel, Dixon, Thomas, Zedolik, Andrew, Fazio, Joe, Kopley, Thomas E.

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  2. 2
    High-Quality Single-Walled Carbon Nanotubes with Small Diameter, Controlled Density, and Ordered Locations Using a Polyferrocenylsilane Block Copolymer Catalyst Precursor

    High-Quality Single-Walled Carbon Nanotubes with Small Diameter, Controlled Density, and Ordered Locations Using a Polyferrocenylsilane Block Copolymer Catalyst Precursor by Lu, Jennifer Q, Kopley, Thomas E, Moll, Nick, Roitman, Daniel, Chamberlin, Danielle, Fu, Qiang, Liu, Jie, Russell, Thomas P, Rider, David A, Manners, Ian

    Published in Chemistry of materials
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  3. 3
    Accurate Intrinsic Gate Capacitance Model for Carbon Nanotube-Array Based FETs Considering Screening Effect

    Accurate Intrinsic Gate Capacitance Model for Carbon Nanotube-Array Based FETs Considering Screening Effect by Kshirsagar, C., Hong Li, Kopley, T.E., Banerjee, K.

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  4. 4
    Three Dimensional Single-Walled Carbon Nanotubes

    Three Dimensional Single-Walled Carbon Nanotubes by Lu, Jennifer, Yuan, Dongning, Liu, Jie, Leng, Weinan, Kopley, Thomas E

    Published in Nano letters
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  5. 5
    The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS

    The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS by Jifa Hao, Pelletier, Mark, Murphy, Robert, McGowan, Brian, Kopley, Thomas E.

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  6. 6
    Building-in ESD/EOS reliability for sub-halfmicron CMOS processes

    Building-in ESD/EOS reliability for sub-halfmicron CMOS processes by Diaz, C.H., Kopley, T.E., Marcoux, P.J.

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  7. 7
    Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS

    Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS by Jifa Hao, Pelletier, Mark, Murphy, Robert, Kopley, Thomas E.

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  8. 8
    High-frequency AC hot-carrier degradation in CMOS circuits

    High-frequency AC hot-carrier degradation in CMOS circuits by Vei-Han Chan, Kopley, T.E., Marcoux, P., Chung, J.E.

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  9. 9
    New method for verification of analytical device models using transistor parameter fluctuations [MOSFETs]

    New method for verification of analytical device models using transistor parameter fluctuations [MOSFETs] by Kuhn, C., Marksteiner, S., Kopley, T.E., Weber, W.

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  10. 10
    Oxide-field dependence of the NMOS hot-carrier degradation rate and its impact on AC-lifetime prediction

    Oxide-field dependence of the NMOS hot-carrier degradation rate and its impact on AC-lifetime prediction by Kim, S.A., Menberu, B., Kopley, T.E., Chung, J.E.

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  11. 11
    Fabrication of Ordered Catalytically Active Nanoparticles Derived from Block Copolymer Micelle Templates for Controllable Synthesis of Single-Walled Carbon Nanotubes

    Fabrication of Ordered Catalytically Active Nanoparticles Derived from Block Copolymer Micelle Templates for Controllable Synthesis of Single-Walled Carbon Nanotubes by Lu, Jennifer, Yi, Sung Soo, Kopley, Thomas, Qian, Cheng, Liu, Jie, Gulari, Erdogan

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