Search Results - Koptyaev, S.N.

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  1. 1
    Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation

    Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation by Ryabko, M V, Koptyaev, S N, Shcherbakov, A V, Lantsov, A D, Oh, S Y

    Published in Optics express
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  2. 2
    Palm-size dual-microcomb source

    Palm-size dual-microcomb source by Dmitriev, N.Yu, Koptyaev, S.N., Voloshin, A.S., Kondratiev, N.M., Lobanov, V.E., Lonshakov, E.A., Min'kov, K.N., Bilenko, I.A.

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