Search Results - Koziukov, A. E.

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  1. 1
    Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs

    Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs by Muthuseenu, K., Barnaby, H. J., Galloway, K. F., Koziukov, A. E., Maksimenko, T. A., Vyrostkov, M. Y., Bu-Khasan, K. B., Kalashnikova, A. A., Privat, A.

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  2. 2
    Analysis of SEGR in Silicon Planar Gate Super-Junction Power MOSFETs

    Analysis of SEGR in Silicon Planar Gate Super-Junction Power MOSFETs by Muthuseenu, K., Barnaby, H. J., Galloway, K. F., Koziukov, A. E., Maksimenko, T. A., Vyrostkov, M. Y., Bu-Khasan, K. B., Kalashnikova, A. A., Privat, A.

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  3. 3
    ISNP/GNEIS Facility in Gatchina for Neutron Testing With Atmospheric-Like Spectrum

    ISNP/GNEIS Facility in Gatchina for Neutron Testing With Atmospheric-Like Spectrum by Shcherbakov, Oleg A., Vorobyev, Alexander S., Gagarski, Alexei M., Vaishnene, Larisa A., Ivanov, Evgeni M., Anashin, Vasily S., Bakirov, Linaris R., Koziukov, Aleksandr E.

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  4. 4
    Commercial Off-The-Shelf MOSFETs SEE Test Results

    Commercial Off-The-Shelf MOSFETs SEE Test Results by Anashin, Vasily S., Chubunov, Pavel A., Koziukov, Aleksandr E., Iakovlev, Sergei A., Maksimenko, Timofey A., Bu-Khasan, Kays B.

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  5. 5
    Research of Noncontact Laser-Based Approach for DUT Heating during Single-Event Effect Tests with Heavy Ion Exposure

    Research of Noncontact Laser-Based Approach for DUT Heating during Single-Event Effect Tests with Heavy Ion Exposure by Mitin, Eugeny V., Nekrasova, Ekaterina N., Anashin, Vasily S., Koziukov, Aleksandr E.

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  6. 6
    TID Response of AD590 Temperature Sensor in Wide Operation Temperature Range

    TID Response of AD590 Temperature Sensor in Wide Operation Temperature Range by Bakerenkov, Alexander S., Felitsyn, Vladislav A., Rodin, Alexander S., Pershenkov, Viacheslav S., Koziukov, Aleksandr E., Podlepetsky, Boris I., Belyakov, Vladimir V., Petkovich, Evgeny V.

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  7. 7
    Heavy Ion Test Results of Different Analog to Digital Converters, Transceivers and Drivers

    Heavy Ion Test Results of Different Analog to Digital Converters, Transceivers and Drivers by Lykov, Vladislav V., Anashin, Vasiliy S., Koziukov, Aleksandr E., Chubunov, Pavel A., Iakovlev, Sergei A., Napolova, Tatiana S., Kolpachkov, Sergei V.

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  8. 8
    Characterization of Widely Used Bipolar Transistors in Wide Temperature Range Before and After Ionizing Radiation Impact

    Characterization of Widely Used Bipolar Transistors in Wide Temperature Range Before and After Ionizing Radiation Impact by Bakerenkov, Alexander S., Koziukov, Aleksandr E., Rodin, Alexander S., Felitsyn, Vladislav A., Pershenkov, Viacheslav S., Glukhov, Nikita S., Belyakov, Vladimir V.

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  9. 9
    SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities

    SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities by Anashin, Vasily S., Koziukov, Aleksandr E., Kazyakin, Anatoly A., Kuznetsov, Alexander S., Bakirov, Linaris R., Korolev, Viacheslav S., Artemyev, Kirill A., Faradian, Konstantin Zh

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