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Search Results - Kras’ko, Mykola M.
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Role of the intensity of high-temperature electron irradiation in accumulation of vacancy-oxygen defects in Cz n-Si
by
Kras’ko, Mykola M.
,
Kolosiuk, Andrii G.
,
Neimash, Volodymyr B.
,
Povarchuk, Vasyl Yu
,
Roguts’kyi, Ivan S.
,
Goushcha, Alexander O.
Published in
Journal of materials research
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Deep Levels in High-Temperature 1 MeV Electron-Irradiated n-Type Czochralski Silicon
by
Simoen, Eddy
,
Rafí, Joan Marc
,
Claeys, Cor
,
Neimash, Vlad
,
Kraitchinskii, Anatolii
,
Kras'ko, Mykola
,
Tischenko, Valerii
,
Voitovych, Vasyl
,
Versluys, Jorg
,
Clauws, Paul
Published in
Japanese Journal of Applied Physics
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Japanese Journal Of Applied Physics
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Japanese Journal Of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
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Japanese Journal Of Applied Physics, Part 1: Regular Papers And Short Notes And Review Papers
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Japanese Journal Of Applied Physics. Part. 1, Regular Papers, Brief Communications & Review Papers
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Journal Of Materials Research
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Subjects
Science & Technology
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Accumulation
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Annealing
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Applied And Technical Physics
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Biomaterials
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Chemistry And Materials Science
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Crystal Defects
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Czochralski Silicon
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Defects Accumulation
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Electron Beams
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Electron Irradiation
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High Temperature
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High-Temperature Electron Irradiation
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High-Temperature Irradiation
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Inorganic Chemistry
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Lattice Vacancies
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Materials Engineering
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Materials Research
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Materials Science
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Materials Science, Multidisciplinary
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Springer Nature
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Cambridge Journals Digital Archive: All To End 2021 Full Collection
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Abi/Inform Global
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Institute Of Physics Iopscience Extra
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Springer Nature - Connect Here First To Enable Access
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