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Autonomous Design in VLSI: Growing and Learning on Silicon
by
Krundel, L A
,
Mulvaney, D J
,
Chouliaras, V A
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User-constrained test architecture design for modular SOC testing
by
Krundel, L.
,
Goel, S.K.
,
Marinissen, E.J.
,
Flottes, M.-L.
,
Rouzeyre, B.
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