Search Results - Kryszczyński, Tadeusz

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  1. 1
    A Reflected-Light-Mode Multiwavelength Interferometer for Measurement of Step Height Standards

    A Reflected-Light-Mode Multiwavelength Interferometer for Measurement of Step Height Standards by Litwin, Dariusz, Radziak, Kamil, Czyżewski, Adam, Galas, Jacek, Kryszczyński, Tadeusz, Błocki, Narcyz, Szumski, Robert, Niedziela, Justyna

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  2. 2
    Material problem in athermalization of optical systems

    Material problem in athermalization of optical systems by Kryszczynski, Tadeusz, Lesniewski, Marcin

    Published in Optical Engineering
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    Guest Editorial: Special Section on Optical Materials for Optical Systems

    Guest Editorial: Special Section on Optical Materials for Optical Systems by Kryszczynski, Tadeusz

    Published in Optical engineering
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