Search Results - Ku, Jachun

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  1. 1
    Characteristics Of SnSbSe (SSS) Thin Films Grown by Atomic Layer Deposition for High Performance Phase Change Random Access Memory (PCRAM)

    Characteristics Of SnSbSe (SSS) Thin Films Grown by Atomic Layer Deposition for High Performance Phase Change Random Access Memory (PCRAM) by Lee, Keun, Kang, Sehun, Ku, Jachun, Hong, Kwon, Park, Sungki

    Published in ECS transactions
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  2. 2
    New Method for Identifying Yield Impacting Polishing Induced Defects (PID) on Polished Silicon Substrates

    New Method for Identifying Yield Impacting Polishing Induced Defects (PID) on Polished Silicon Substrates by Kim, KeunSu, Moon, Byeongsam, Suh, Hyo Sik, Kim, Jiae, Venkat, Sivakumar, Lee, Sanghyun, Shen, William, Shin, Yong, Park, Jonggeun, An, Jeonghoon, Seo, Scott, Ku, Jachun, Park, SungKi, Saito, Jason, Douglas, Carlotte

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  3. 3
    Improvement of Contact Resistance with Molecular Ion Implantation

    Improvement of Contact Resistance with Molecular Ion Implantation by Lee, Kyung Won, Lee, Jin Ku, Oh, Jae Geun, Huh, Tae Hoon, Ju, Min Ae, Jeon, Seung Joon, Ku, Ja Chun, Park, Sung Ki, Kim, Steve, Yoon, Dae Ho, Ra, Geum Joo, Harris, Mark A, Reece, Ronald N

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  4. 4
    Novel shallow trench isolation process using flowable oxide CVD for sub-100 nm DRAM

    Novel shallow trench isolation process using flowable oxide CVD for sub-100 nm DRAM by Sung-Woong Chung, Sang-Tae Ahn, Hyun-Chul Sohn, Jachun Ku, Sungki Park, Yong-Wook Song, Hyo-Sik Park, Sang-Don Lee

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  5. 5
    Novel shallow trench isolation process using flowable oxide CVD for sub-100nm DRAM

    Novel shallow trench isolation process using flowable oxide CVD for sub-100nm DRAM by CHUNG, Sung-Woong, AHN, Sang-Tae, SOHN, Hyun-Chul, KU, Jachun, PARK, Sungki, SONG, Yong-Wook, PARK, Hyo-Sik, LEE, Sang-Don

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