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Characterization of reactions at titanium/nickel silicide interface using X-ray photoelectron spectroscopy and transmission electron microscopy
by
Zhao, Jin
,
Lu, Jiong-Ping
,
Xu, Yu-Qing
,
Kuan, Yu-Ji R
,
Tsung, Lancy
Published in
Applied surface science
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Applied Surface Science
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Chemistry
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Chemistry, Physical
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Condensed Matter: Structure, Mechanical And Thermal Properties
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Contact Resistance
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Exact Sciences And Technology
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Four-Point Probe
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Interface Structure And Roughness
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Interfacial Reaction
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Low-Dimensional Structures : Structure, And Nonelectronic Properties
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Materials Science
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Materials Science, Coatings & Films
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Nickel Silicide
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Physical Sciences
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Physics
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Physics, Applied
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Physics, Condensed Matter
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Science & Technology
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Silicon Consumption
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Solid Surfaces And Solid-Solid Interfaces
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Surfaces And Interfaces; Thin Films And Whiskers
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Sciencedirect Journals
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Sciencedirect Freedom Collection
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Elsevier Sd Backfile Materials Science
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Sciencedirect Physics Backfile
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