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Diagnosis and Layout Aware (DLA) Scan Chain Stitching
by
Jing Ye
,
Yu Huang
,
Yu Hu
,
Wu-Tung Cheng
,
Ruifeng Guo
,
Liyang Lai
,
Ting-Pu Tai
,
Xiaowei Li
,
Weipin Changchien
,
Daw-Ming Lee
,
Ji-Jan Chen
,
Eruvathi, Sandeep C.
,
Kumara, Kartik K.
,
Liu, Charles
,
Sam Pan
Published in
IEEE transactions on very large scale integration (VLSI) systems
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Diagnosis and Layout Aware (DLA) scan chain stitching
by
Jing Ye
,
Yu Huang
,
Yu Hu
,
Wu-Tung Cheng
,
Ruifeng Guo
,
Liyang Lai
,
Ting-Pu Tai
,
Xiaowei Li
,
Weipin Changchien
,
Daw-Ming Lee
,
Ji-Jan Chen
,
Eruvathi, Sandeep C.
,
Kumara, Kartik K.
,
Liu, Charles
,
Sam Pan
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Ieee Transactions On Very Large Scale Integration
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Automatic Test Pattern Generation
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