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    Beam tests of ATLAS SCT silicon strip detector modules by Campabadal, F., Ullan, M., Ciocio, A., Gilchriese, M., Haber, C., Wilson, J.A., Barr, A.J., Fromant, B.P., Parker, M.A., Sabetfakhri, A., Chesi, E., Ferrari, P., Kaplon, J., Niinikoski, T., Wallny, R., Weilhammer, P., Bialas, W., Dabrowski, W., Koperny, S., Blocki, J., Bruckman, P., Gornicki, E., Malecki, P., Stanecka, E., Stodulski, M., Szczygiel, R., Ahmad, A., Benes, J., Feld, L., Runge, K., Mikulec, B., Donega, M., Ferrere, D., Perrin, E., Weber, M., Cheplakov, A., Saxon, D.H., Ohsugi, T., Kohriki, T., Terada, S., Ujiie, N., Ikegami, Y., Unno, Y., Chilingarov, A., Sloan, T., Allport, P.P., Sutcliffe, P., Vossebeld, J., Nagai, K., Fraser, T.J., Jones, T.W., Cindro, V., Mandić, I., Mikuž, M., Duerdoth, I.P., Snow, S.W., Atkinson, T.M., Bright, G., Lindsay, S., Bachindgagyan, G., Baranova, N., Andricek, L., Lutz, G., Moser, H.-G., Cornelissen, T., Gorfine, G.W., Hessey, N.P., Muijs, A.J.M., Peeters, S.J.M., Huse, T., Stapnes, S., Nickerson, R., Lau, W., Howell, D., Brož, J., Doležal, Z., Kodyš, P., Vorobel, V., Solar, M., Vorobiev, A.P., Adkin, P.J., Easton, J.M., Gibson, M.D., Matheson, J.P., Morrissey, M., Seiden, A., Spencer, E., Wilder, M., Buttar, C.M., Grigson, C., Varvell, K.E., Chu, Ming-Lee, Wan, Changchun, Hara, K., Minagawa, M., Bernabeu, J., Lacasta, C., Llosa, G., Vos, M., Charles, E.

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