Search Results - Kunho Kwak

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  1. 1
    A 500-MHz DDR High-Performance 72-Mb 3-D SRAM Fabricated With Laser-Induced Epitaxial c-Si Growth Technology for a Stand-Alone and Embedded Memory Application

    A 500-MHz DDR High-Performance 72-Mb 3-D SRAM Fabricated With Laser-Induced Epitaxial c-Si Growth Technology for a Stand-Alone and Embedded Memory Application by Soon-Moon Jung, Hoon Lim, Kwak, K.H., Kinam Kim

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  2. 2
    High Speed and Highly Cost effective 72M bit density S3 SRAM Technology with Doubly Stacked Si Layers, Peripheral only CoSix layers and Tungsten Shunt W/L Scheme for Standalone and Embedded Memory

    High Speed and Highly Cost effective 72M bit density S3 SRAM Technology with Doubly Stacked Si Layers, Peripheral only CoSix layers and Tungsten Shunt W/L Scheme for Standalone and... by Soon-Moon Jung, Hoon Lim, Chadong Yeo, Kunho Kwak, Byoungkeun Son, Hanbyung Park, Jonghoon Na, Jae-Joo Shim, Changmin Hong, Kinam Kim

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  3. 3
    Highly area efficient and cost effective double stacked S/sup 3/ (stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM

    Highly area efficient and cost effective double stacked S/sup 3/ (stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM by Soon-Moon Jung, Hoon Lim, Wonseok Cho, Hoosung Cho, Chadong Yeo, Yongha Kang, Daegi Bae, Jonghoon Na, Kunho Kwak, Bonghyun Choi, Sungjin Kim, Jaehun Jeong, Youngchul Chang, Jaehoon Jang, Jonghyuk Kim, Kinam Kim, Byung-Il Ryu

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  4. 4
    Highly area efficient and cost effective double stacked S3(stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM

    Highly area efficient and cost effective double stacked S3(stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM by JUNG, Soon-Moon, LIM, Hoon, KIM, Sungjin, JEONG, Jaehun, CHANG, Youngchul, JANG, Jaehoon, KIM, Jonghyuk, KIM, Kinam, RYU, Byung-Il, CHO, Wonseok, CHO, Hoosung, YEO, Chadong, YONGHA KANG, BAE, Daegi, NA, Jonghoon, KWAK, Kunho, CHOI, Bonghyun

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  5. 5
    Endurable IGZO/SnSx/IGZO Heterojunction Phototransistor Arrays for Image Sensors

    Endurable IGZO/SnSx/IGZO Heterojunction Phototransistor Arrays for Image Sensors by Park, Kyungho, Kang, Byung Ha, An, Jong Bin, Jung, Sujin, Moon, Kunho, Kwak, Kyungmoon, Chung, Jusung, Choi, Dong Hyun, Hwang, Yong Seon, Kim, Hyun Jae

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  6. 6
    Endurable IGZO/SnS x /IGZO Heterojunction Phototransistor Arrays for Image Sensors

    Endurable IGZO/SnS x /IGZO Heterojunction Phototransistor Arrays for Image Sensors by Park, Kyungho, Kang, Byung Ha, An, Jong Bin, Jung, Sujin, Moon, Kunho, Kwak, Kyungmoon, Chung, Jusung, Choi, Dong Hyun, Hwang, Yong Seon, Kim, Hyun Jae

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  7. 7
    A risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score

    A risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score by Yhim, Ho-Young, Park, Yong, Han, Yeon-Hee, Kim, Sungeun, Kang, Sae-Ryung, Moon, Joon-Ho, Jeong, Ju Hye, Shin, Ho-Jin, Kim, Keunyoung, Choi, Yoon Seok, Kim, Kunho, Kim, Min Kyoung, Kong, Eunjung, Kim, Dae Sik, Eo, Jae Seon, Lee, Ji Hyun, Kang, Do-Young, Lee, Won Sik, Lee, Seok Mo, Do, Young Rok, Ham, Jun Soo, Kim, Seok Jin, Kim, Won Seog, Choi, Joon Young, Yang, Deok-Hwan, Kwak, Jae-Yong

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  8. 8
    Correction to: a risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score

    Correction to: a risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score by Yhim, Ho-Young, Park, Yong, Han, Yeon-Hee, Kim, Sungeun, Kang, Sae-Ryung, Moon, Joon-Ho, Jeong, Ju Hye, Shin, Ho-Jin, Kim, Keunyoung, Choi, Yoon Seok, Kim, Kunho, Kim, Min Kyoung, Kong, Eunjung, Kim, Dae Sik, Eo, Jae Seon, Lee, Ji Hyun, Kang, Do-Young, Lee, Won Sik, Lee, Seok Mo, Do, Young Rok, Ham, Jun Soo, Kim, Seok Jin, Kim, Won Seog, Choi, Joon Young, Yang, Deok-Hwan, Kwak, Jae-Yong

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  9. 9
    Reliability and Validity of the Korean Version of the General-Food Craving Questionnaire-Trait for Children

    Reliability and Validity of the Korean Version of the General-Food Craving Questionnaire-Trait for Children by JoEun Jeong, DongJin Jung, Minjung Kwak, HaeKyung Yang, SunYoung Lim, JinHee Lee, KunHo Yoon, DaiJin Kim

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