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Novel integration technologies for improving reliability in NAND flash memory
by
Hyunyoung Shim
,
Myoungkwan Cho
,
Kunok Ahn
,
Gihyun Bae
,
Sungwook Park
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Highly reliable M1X MLC NAND flash memory cell with novel active air-gap and p+ poly process integration technologies
by
Seo, Jihyun
,
Han, Kyoungrok
,
Youn, Taeun
,
Heo, Hye-Eun
,
Jang, Sanghyun
,
Kim, Jongwook
,
Yoo, Honam
,
Hwang, Joowon
,
Yang, Cheolhoon
,
Lee, Heeyoul
,
Kim, Byungkook
,
Choi, Eunseok
,
Noh, Keumhwan
,
Lee, Byoungki
,
Lee, Byungseok
,
Chang, Heehyun
,
Park, Sungkye
,
Ahn, Kunok
,
Lee, Seokkiu
,
Kim, Jinwoong
,
Lee, Seokhee
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Effect of Inhomogeneous Nucleation of Hydride at α/β Phase Boundary on Microstructure Evolution of Zr–2.5 wt%Nb Pressure Tube
by
Kim, Sung-Soo
,
Lim, Sangyeob
,
Ahn, Dong-Hyun
,
Lee, Gyeong-Geun
,
Chang, Kunok
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Metals and materials international
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Metals And Materials International
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Doping
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Flash Memory
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Interference
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Logic Gates
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Reliability
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Science & Technology
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Air Gaps
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Beta Phase
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Bit Error Rate
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Channels
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Characterization And Evaluation Of Materials
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Chemistry And Materials Science
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Delayed Hydride Cracking
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Density
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Differential Scanning Calorimetry
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2025
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