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    Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in Cu

    Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in Cu by Shih, Jhih-Wun, Kuo, Ka-Wei, Kuo, Jui-Chao, Kuo, Tsung-Yuan

    Published in Ultramicroscopy
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