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Study of mechanisms responsible for the efficiency degradation of the III-nitrides light emitting diodes
by
Shmidt, N.M.
,
Usikov, A.S.
,
Shabunina, E.I.
,
Chernyakov, A.E.
,
Kurin, S.Yu
,
Makarov, Yu.N.
,
Helava, H.
,
Papchenko, B.P.
Published in
Nauchno-tekhnicheskiĭ vestnik informat͡s︡ionnykh tekhnologiĭ, mekhaniki i optiki
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Nauchno-Tekhnicheskiĭ Vestnik Informat͡s︡ionnykh Tekhnologiĭ, Mekhaniki I Optiki
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Degradation
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Light Emitting Diodes Based On Iii-Nitrides
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Mechanisms Of Defects Generation
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System Of Extended Defects
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