Search Results - Kurlej, Arthur

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  1. 1
    Performance of algorithms for emerging ion-trap quantum hardware

    Performance of algorithms for emerging ion-trap quantum hardware by Kurlej, Arthur, Alterman, Sam, Obenland, Kevin

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  2. 2
    Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober

    Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober by West, Joshua T., Kurlej, Arthur, Wynn, Alex, Rogers, Chad, Gouker, Mark A., Tolpygo, Sergey K.

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    Automatic 4 K Cryogenic Probe Station for DC and Microwave Measurements on 150-mm and 200-mm Wafers

    Automatic 4 K Cryogenic Probe Station for DC and Microwave Measurements on 150-mm and 200-mm Wafers by West, Joshua T., Kurlej, Arthur, Wynn, Alex, Rogers, Chad, Gouker, Mark A., Tolpygo, Sergey K.

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  4. 4
    Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober

    Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober by West, Joshua T, Kurlej, Arthur, Wynn, Alex, Rogers, Chad, Gouker, Mark A, Tolpygo, Sergey K

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