Search Results - Kushchenkov, S. A.

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  1. 1
    Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO{sub 2}/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy

    Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO{sub 2}/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy by Parshin, A. S., Kushchenkov, S. A., Pchelyakov, O. P., Mikhlin, Yu. L.

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  2. 2
    Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO2/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy

    Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO2/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy by Parshin, A. S., Kushchenkov, S. A., Pchelyakov, O. P., Mikhlin, Yu. L.

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  3. 3
    Simulating the cross section of inelastic scattering of electrons in layered structures on the basis of dielectric functions and experimental spectra of the film and substrate

    Simulating the cross section of inelastic scattering of electrons in layered structures on the basis of dielectric functions and experimental spectra of the film and substrate by Parshin, A. S., Kushchenkov, S. A., Pchelyakov, O. P., Mikhlin, Yu. L.

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  4. 4
    New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures

    New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures by Parshin, A. S., Kushchenkov, S. A., Aleksandrova, G. A., Ovchinnikov, S. G.

    Published in Technical physics
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  5. 5
    Spectroscopy of the cross section of inelastic scattering of electrons in SiO2/Si(100) layered systems

    Spectroscopy of the cross section of inelastic scattering of electrons in SiO2/Si(100) layered systems by Parshin, A. S., Kushchenkov, S. A., Pchelyakov, O. P., Mikhlin, Yu. L., Khasanov, T.

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  6. 6
    Reflection electron-energy-loss spectroscopy of FexSi1 − x thin films

    Reflection electron-energy-loss spectroscopy of FexSi1 − x thin films by Parshin, A. S., Alexandrova, G. A., Dolbak, A. E., Pchelyakov, O. P., Ol’shanetskiĭ, B. Z., Ovchinnikov, S. G., Kushchenkov, S. A.

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  7. 7
    Study of Fe/Si magnetic layered nanostructures by reflected electron energy loss spectroscopy

    Study of Fe/Si magnetic layered nanostructures by reflected electron energy loss spectroscopy by Parshin, A. S., Aleksandrova, G. A., Varnakov, S. N., Kushchenkov, S. A., Ovchinnikov, S. G.

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  8. 8
    Reflection electron-energy-loss spectroscopy of Fe x Si1 − x thin films

    Reflection electron-energy-loss spectroscopy of Fe x Si1 − x thin films by Parshin, A. S., Alexandrova, G. A., Dolbak, A. E., Pchelyakov, O. P., Ol’shanetskiĭ, B. Z., Ovchinnikov, S. G., Kushchenkov, S. A.

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  9. 9
    Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure Si[O.sub.2]/Si by inelastic electron scattering cross-section spectroscopy

    Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure Si[O.sub.2]/Si by inelastic electron scattering cross-section spectroscopy by Parshin, A.S, Kushchenkov, S.A, Pchelyakov, O.P, Mikhlin, Yu. L

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