Search Results - Kushchenkov, S.A

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    Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure Si[O.sub.2]/Si by inelastic electron scattering cross-section spectroscopy

    Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure Si[O.sub.2]/Si by inelastic electron scattering cross-section spectroscopy by Parshin, A.S, Kushchenkov, S.A, Pchelyakov, O.P, Mikhlin, Yu. L

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    New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures

    New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures by Parshin, A. S., Kushchenkov, S. A., Aleksandrova, G. A., Ovchinnikov, S. G.

    Published in Technical physics
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